The Genesis® software family of yield enhancement solutions is an industry-leading, established solution for optimizing and understanding semiconductor (fab and fabless) and Flat Panel Display (FPD) yields. A powerful suite of data visualization, analysis and reporting tools uses patented technology to seamlessly handle data from any source in leading edge production lines.
For more information about Genesis software, please contact us. For information about online yield analysis, see Discover Software.
Genesis Enterprise:
This software tool for semiconductor manufacturers offers a complete yield management enterprise platform that combines parametric, defect and yield optimization with data mining and workflow development across all data sources from memory and design to assembly and packaging.
With its patented Yield Mine® automated decision making technology, Genesis reduces the time it takes to find root causes of yield excursions. With its comprehensive, production-proven YieldBase® and Metadata™ package, Genesis enables its customers to broaden their analysis scope for better yield.
The software also includes data acquisition and integration, a development environment through workflow and scripting, and specialized analysis algorithms to identify domain-specific issues, such as data mining, spatial anomalies, wafer processing sequence problems, commonality of effects, system and random yield loss.
In addition, Genesis provides two distinct tools – Principal Components and multivariate analysis of variance (MANOVA) – that allow systematic, simultaneous examination of multiple variables. These tools are combined with the market proven data mining technology to provide a powerful tool set for yield analysis.
Genesis Fabless:
This yield maximization software platform draws from the same effective technology featured in Genesis Enterprise but is specially engineered to include the unique features needed to meet the test and optimization challenges of today’s fast moving fabless sector. Specialized analysis algorithms quickly ascertain the impact of design on the “manufacturability” of the chips produced. Genesis Fabless improves device time to market through a closer link between fab and foundry, with features commonly used to reduce cycle time for integrated device manufacturers, such as parameter sensitivity analysis, marginal parameters analysis, test sequence correlation analysis, and guardbanding.
A turnkey option provides a pre-configured database with pre-loaded software for rapid uptime at an affordable price. Data analysts, engineers, and managers can quickly begin to utilize the scalable platform in managing multiple data sets from outsourced operations around the world.
Genesis FPD:
Specifically engineered for the thin-film transistor liquid crystal display (TFT-LCD) market, Genesis FPD enables Flat Panel Display manufacturers to meet the escalating production challenges posed by large volumes of product, growing plate sizes, and increasing screen resolutions. Genesis FPD reduces the analysis time required to find root causes of yield issues through data collection, storage, visualization, and daily production yield monitoring and reporting. Trace and analyze years of data on products shipped to the market.