Discover™ is an inline defect analysis and data management system designed to seamlessly handle advanced macro frontside, edge and backside inspection results. With built-in wafer level ADC, Discover enables quick identification of damaging killer defects that can ruin the entire wafer. Device failure can now be correlated to backside and edge defects in a single intuitive screen. Designed with process excursion detection ability, Discover can automatically issue alarms and trigger user-defined macros that reproduce skilled decision-making steps. Creating, deploying and managing all-surface wafer inspection sampling plans have never been easier. Discover is the perfect solution for your all-surface analysis needs.

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