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Discover Enterprise Software

A third-generation and production-tested system, Discover Enterprise™ is the most widely used data management system commercially available. It flexibly links to the process equipment of choice, has an outstanding record of high uptime, precisely correlates electrical and other test results to your inspection information, and links into your existing databases. With production experience in Memory, Logic, Microprocessor, ASIC, foundry, and LED, Discover Enterprise became the market leader in data management systems by flexibly integrating into the yield management strategy of its customers.

 

Easy, fast access to yield and fab-wide information

 

For fab managers and production planners: Discover Enterprise provides easy access to yield impact and line performance information making it possible to predict yields and adjust production as needed across different facilities.

 

For yield and defect engineers: Discover Enterprise provides a wealth of analysis tools that make it possible to find the source of killer defects quickly—even among very small die, perform the most comprehensive edge defect and EBR analysis in the industry, and quickly determine if emerging defects are impacting yield. Customizable and comprehensive pass-down reports are automatically generated saving process engineers hours each day.

 

For operators: Discover Enterprise's intuitive graphical user interface (GUI) and fast database processing make it easy to collect information and respond to problems in a timely matter. Alarm automatically includes history information to guide operators/technicians.

 

Partnering with customers to create data management solutions

 

Designed for growth and enhancements, Discover Enterprise's open architecture, industry-standard file formats and scalable system enables it to meet the needs of any factory in the world, addressing challenges such as partial wafer processing and aligning wafer maps across tools sets.

 

The software combines leading-edge technology with the innovative analysis capabilities acquired from extensive experience partnering with high-volume manufacturers of integrated circuits, LEDs, flat-panel displays, and magnetic read heads.

 

For more information about Discover Enterprise Software, please contact us.

Overview

  • Multiple wafer map display options to meet various needs
  • Flexible reporting capabilities with charts for almost any data in the database, single-click export into Excel, and web hosting of reports for sharing information
  • Sophisticated analysis and correlation capabilities to help yield engineers quickly identify the root cause of yield impact problems
  • Handle data from the entire manufacturing supply chain: inspection, metrology, yield, etest, process equipment data, MES, customer third party and legacy systems
  • Built-in step-contribution analysis, clustering process, hot spot detection, automated signature analysis
  • Alignment of wafer maps from various data types: bare and pattern inspection as well as BIN and Etest
  • Designed to handle small die applications such as LED and automotive, 200K per wafer and up
  • Partial wafer processing (broken wafers) analysis and tracking
  • Commonality analysis to relate problems back to equipment
  • Provide statistical tools such as regression, t-test, Ca, Cpk, ANOVA and other methods
  • SPC capabilities for all the data sources with user-definable rules
  • Defect and Sort Spatial Pattern Recognition system designed to separate random from systemic yield loss
  • Visualization techniques necessary for root cause analysis
  • Secure access control method to allow for information sharing among customers
  • Paramount system up-time for un-interrupted information flow
  • Provide solutions in configurable modules for defect, sort, WIP, metrology, WAT(WET) and bitmap
  • Support all inspection tools and review tools in the fab floor