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Discover Enterprise Software

A third-generation and production-tested system, Discover Enterprise™ is the most widely used data management system commercially available. It flexibly links to the process equipment of choice, has an outstanding record of high uptime, precisely correlates electrical and other test results to your inspection information, and links into your existing databases such as MES/WIP, Sort, Bitmap, WET/WAT, and others. With production experience in Memory, Logic, Microprocessor, ASIC, foundry, and other fabs, DMSVision (a predecessor to Discover Enterprise) became the market leader in data management systems by flexibly responding to customer's needs. We work with our customers to incorporate Discover Enterprise into their yield management strategy.

 

Easy, fast access to yield and fab-wide information

 

For fab managers and production planners: Discover Enterprise provides easy access to yield impact and line performance information. Thus making it possible to predict yields and make necessary production adjustments across different facilities.

 

For yield and defect engineers: Discover Enterprise provides a wealth of analysis tools that make it possible to find the source of killer defects quickly, perform the most comprehensive edge defect and EBR analysis in the industry, and quickly determine if emerging defects are impacting yield. Customizable and comprehensive pass-down reports are automatically generated saving process engineers hours each day.

 

For operators: Discover Enterprise's intuitive graphical user interface (GUI) and fast database processing make it easy to collect information and respond to problems in a timely matter. Alarm automatically include history information to guide operators/technicians.

 

Partnering with customers to create data management solutions

 

Discover Enterprise's open architecture and scalable system make it possible to meet the needs of any fab in the world. Industry-standard file formats are supported to facilitate the interface to the Discover Enterprise database.

 

Discover Enterprise is designed for growth and enhancements. The software combines leading-edge technology with extensive experience creating data management solutions for many high volume manufacturers of integrated circuits, flat-panel displays, and magnetic read heads. Working with partners with the semiconductor industry continually adds innovative analysis capabilities to Discover Enterprise.

 

For more information about Discover Enterprise Software, please contact us.

Overview

  • A yield management system for the entire semiconductor manufacturing process
  • Multiple wafer map display options to meet various needs
  • Flexible reporting capabilities with charts for almost any data in the database, and web hosting of reports for sharing information
  • Sophisticated analysis and correlation capabilities to help yield engineers quickly identify the root cause of yield impact problems
  • Built-in step-contribution analysis, clustering process, hot spot detection
  • Commonality analysis to relate problems back to equipment
  • Provide statistical tools such as regression, t-test, Ca, Cpk, ANOVA and other methods
  • Defect Spatial Pattern Recognition system included for detecting mechanical scratches, rings, CMP scratches, and customer-definable patterns
  • SPC capabilities for all the data sources with user-definable rules
  • Single-click to export data and charts into Excel
  • Secure access control method to allow for information sharing among customers
  • Paramount system up-time for un-interrupted information flow
  • Provide solutions for defect, sort, WIP, metrology, WAT(WET) and bitmap, in configurable modules
  • Support all inspection tools and review tools in the fab floor
  • Easy-to-use user interface