Rudolph Technologies provides process characterization solutions and applications support for semiconductor manufacturers around the world. The company's product portfolio for wafer processing customers includes high-performance metrology systems for opaque and transparent film measurement, sophisticated yield management software on a fabwide scale and automated macro defect inspection systems that can identify and analyze defects on all surfaces of a silicon wafer. Products and technologies developed primarily for final manufacture and test include software products for defect analysis and review, high-speed macro defect inspection systems and probe card test and analysis solutions. With a strong history beginning in 1940, our strategy for continued technological and market leadership includes aggressive research and development, and dedicated applications support on a global scale.

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