July 15-17, 2008

San Francisco, California

Moscone Center

Booth 1621, South Hall

Update for analysts and investors:

0830 July 16, Room 256
Moscone W. Mezzanine

Visit Rudolph at SEMICON® West to learn more about our metrology and macro defect inspection solutions, as well as our latest software capabilities. We look forward to seeing you there.

Rudolph Technologies is a worldwide leader in the design, development, manufacture and support of high-performance process characterization systems that include metrology, defect inspection and data analysis systems used by semiconductor device manufacturers. Rudolph solutions, found in wafer processing and final packaging environments, provide critical yield-enhancing information, enabling microelectronic device manufacturers to drive down costs and time to market. Rudolph's strategy for continued technological and market leadership includes aggressive R&D of complementary metrology and inspection solutions. Headquartered in Flanders, New Jersey, Rudolph supports its customers with global customer support.