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Highlights
Presents at 14th Annual Global Needham Company Growth Conference
Announces Participation in Upcoming Investor Conferences
Receives First Orders for 450mm Defect Inspection and Thin Film Metrology Systems
Fulfills Multiple System Orders for TSV Inspection and Metrology
Delivers Run-to-Run Process Control to Bosch Automotive
Announces Shipment of 1000th NSX Inspection System
Presents at the Rodman & Renshaw Annual Global Investment Conference
Receiving Ruling Issued in Rudolph's Patent Infringement Case Against Camtek
Participates in the Morgan Stanley 2011 Semiconductor and Semi-Cap Equipment Corporate Access Day
Presents at the Oppenheimer 14th Annual Technology Conference in Boston
Prices Offering of $50 Million of 3.75% Convertible Senior Notes Due 2016
Launches Genesis Enterprise 7.0 Software for Semiconductor Yield Enhancement