The WaferWoRx 300®, through analysis of the probe mark, reveals the true performance under actual test conditions of the prober, probe card, and setup. Replacing time-consuming manual analysis with automated probe mark data collection and analysis, the WaferWoRx 300 delivers quantifiable data and easy-to-interpret results in minimal time, enabling you to rapidly assess your probing process, identify and analyze issues within the process, and define solution options.