Rudolph : 2003 News Archive

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2003 News Archive

Rudolph Technologies Sees Q4 Revenue Growth at High End of Previous Range of 6% - 10%

12/10/2003

Rudolph Technologies’ EASy Provides Production-Worthy Opaque Film Metrology for 90 nm Processes

11/12/2003

Rudolph Technologies Posts Sequential Growth in Revenue, Gross Margin and EPS

10/27/2003

Rudolph Technologies’ New Wafer-Bow/Stress Metrology Tool is Designed for High-Volume Semiconductor Manufacturing

10/16/2003

Rudolph Technologies Schedules Third Quarter Conference Call for October 27, 2003

10/07/2003

Rudolph Technologies Files Counterclaim Arising From Intellectual Property Dispute

09/30/2003

Rudolph Receives Multi-Million Dollar Order From Major Taiwanese Manufacturer

09/09/2003

Rudolph Technologies Introduces ultra-II for the 90 and 65 nm Technology Nodes and for 193 nm Lithography

08/13/2003

Rudolph Maintains Profitability and Generates Strong Cash Flow in Second Quarter

08/04/2003

Rudolph Receives Repeat Order for MetaPULSE-II from Leading Foundry in Taiwan

06/03/2003