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2004 News Archive

Rudolph Technologies Announces Record Sales in Taiwan Region

12/13/2004

Rudolph Technologies Extends WaferView Macrodefect Inspection into Back-end Bump Applications

12/01/2004

Major Korean Memory Chip Maker Places Repeat Orders for Rudolph Technologies’ MetaPULSE Metrology Tools

11/11/2004

Rudolph Technologies Reports Third Quarter Revenue In-line with Guidance; EPS Above Guidance

11/01/2004

Rudolph Technologies Honored for Workplace Safety

10/13/2004

Rudolph Technologies Schedules Third Quarter Conference Call For November 1, 2004

10/05/2004

Rudolph Technologies Receives Record Orders for MetaPULSE-II from Major Taiwanese Foundry

09/22/2004

Rudolph Technologies Announces Expansion in Japan

09/13/2004

Rudolph Technologies Receives Multiple Tool Order for Automated Macro Defect Inspection

09/08/2004

Rudolph Technologies and August Technology Announce Litigation Settlement

08/06/2004

Rudolph Technologies Second Quarter Results Exceed Expectations; Reports Better-Than-Expected Revenue and Earnings

07/26/2004

Rudolph Technologies introduces industry’s smallest Process Control Module fully integrated into the Tokyo Electron TELFORMULA Thermal Processing System without any impact to the system footprint

07/14/2004

Tokyo Electron Selects Rudolph for Integrated Macrodefect Inspection in its CLEAN TRACK Systems

07/14/2004

Rudolph Technologies Announces New WaferView 320 Turbo High Throughput Macrodefect Inspection System

07/12/2004

Rudolph Technologies Introduces High Resolution Integrated Module for Macrodefect Inspection

07/12/2004

Rudolph Technologies Schedules Second Quarter Conference Call For July 26, 2004

07/07/2004

Rudolph Technologies Announces New WaferView 325 Macrodefect Inspection “All in One” Tool

06/21/2004

Rudolph Technologies Reports Better-Than-Expected Revenue and Earning of $18.9 Million and Diluted EPS of $0.06

04/26/2004

Rudolph Technologies Announces New Automated Macrodefect Inspection Team

04/01/2004

Rudolph Technologies Receives 100th Order for Copper Film Metrology System

03/17/2004

Rudolph Technologies’ ‘Best-of-Breed’ Tools Gaining Momentum as the Company Begins Shipping Tools from Largest Order in Company History

02/26/2004

Rudolph Technologies Exceeds Prior Guidance as Fourth Quarter Revenue and Earnings Increase Sequentially

02/02/2004

Nanotec 300 Purchases Rudolph Technologies’ S300-ultra Metrology System for 45 nm Processes

01/09/2004

Rudolph Technologies Schedules Fourth Quarter and Year End Conference Call for Monday, February 2, 2004

01/08/2004