Presented by AMD at ASMC 2007

Winner of the ASMC 2007 Best Paper Award

Abstract

Modern semiconductor manufacturing facilities process thousands of wafers a week and produce enormous volumes of data that must be quickly and efficiently mined for yield signals. AMD has embarked on a project with Rudolph Technologies to create an automated pattern recognition system for use in AMD manufacturing and test facilities. This paper will explain what advantages are gained by deploying an automated spatial pattern classification system, as well as some of the challenges in making the system successful. We will also give examples of how SPR information is used for control, problem identification, and ultimately root cause determination in a high volume fab environment.

The automated SPR system referred to in this paper is Process Sentinel™ process control software from Rudolph Technologies. Process Sentinel is the first combined sort and defect SPR software designed to be independent of a fab's existing yield management package.

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