January 12, 2009
Rudolph Introduces Solar Fab Management Software for Photovoltaic Production
First software tool designed specifically to help solar cell manufacturers improve energy conversion efficiency and process yield
February 9, 2009
Rudolph Announces Probing Process Analysis Capability for NSX Wafer Inspection System
New in-line capability provides accelerated probe test failure analysis and lower cost of ownership
March 5, 2009
Rudolph Announces Favorable Verdict in Patent Infringement Lawsuit
Jury finds Camtek Falcon System infringes Rudolph’s Patent
April 14, 2009
Rudolph Technologies Schedules 2009 First Quarter Earnings Conference Call for May 7, 2009
April 20, 2009
Rudolph Technologies and SEMATECH Extend Collaboration at UAlbany NanoCollege
Joint development research will focus on 3D TSV process control
May 11, 2009
Rudolph Announces New MetaPULSE-G Copper Film Metrology System
Latest PULSE™ Technology offers complete copper process control solution for advanced technology nodes and emerging TSV applications
June 15, 2009
Rudolph Announces All Surface Front-end Inspection Sale to Memory Manufacturer
Taiwan DRAM manufacturer orders all-surface inspection system for front-end manufacturing process control
July 13, 2009
Rudolph’s New S3000S Metrology System Delivers Cost of Ownership Advantage
Simultaneous advanced film characterization mode is first on market, delivering higher throughput and enhanced measurement capability
July 23, 2009
Rudolph Announces Multiple Orders for New Wafer Scanner 3840 Systems
Recent acquisition integration and WS3840 development well timed to meet market demand for high-speed 3D bump inspection and metrology
July 28, 2009
Rudolph Technologies Receives Multiple Orders for Production Opaque Film Metrology
On-product measurement capability, high precision and low cost of ownership drive selection of Rudolph’s MetaPULSE® Systems by major Asian memory manufacturer
August 3, 2009
Rudolph Technologies Acquires Adventa Control Technologies, Inc.
Company creates a complete enterprise solution in response to market demands
August 6, 2009
Rudolph Technologies Announces Second Quarter Revenue Increases 39% Exceeding Guidance
September 9, 2009
Court Judgment Favors Rudolph Technologies Patent Infringement Case
Permanent injunction entered against Camtek prohibits sale of Falcon Systems in USA
September 16, 2009
Rudolph Technologies Indicates Recovery Taking Hold, Back-end Semiconductor Manufacturing Heating Up
Strong orders coming from industry’s largest four OSATs and major foundries; sets the stage for upbeat SEMICON Taiwan in late September
September 29, 2009
Rudolph Now Offers Complete Solution for 200 and 300mm Gold Bump Inspection
September 29, 2009
Rudolph Technologies Releases Fast Review and Die Sort Classification Software for Back-end Manufacturing
Discover Software is able to dramatically reduce time and cost of defect review in back-end process environments
October 6, 2009
Rudolph Schedules Q3 Conference Call
October 8, 2009
Rudolph Technologies Receives Multiple System Order from ASE for its Complete Portfolio of Back-end Inspection Solutions
Rudolph sees significant market potential as leading manufacturers implement data analysis capability in their 2D and 3D in-line inspection for advanced packaging processes
November 2, 2009
Rudolph Technologies Announces Third Quarter Revenue Increases 52 Percent Exceeding Guidance
November 9, 2009
Rudolph’s Automated Data Analysis Software Improves Yield in MEMS Inspection
Touch Micro-SystemTech adds NSX with Discover Software to dramatically reduce per-wafer inspection time
December 8, 2009
Rudolph Announces Multiple Orders for Explorer Inspection Cluster from Taiwan Foundry
Automatic waferless recipe creation proves to provide added productivity for CMP inspection in a foundry environment
