Opaque Film Metrology
Requirements for data storage are projected to increase up to 40X by 2020
Driving this explosive growth are advancements in consumer electronics, cloud computing and IT management— all requiring fast, flexible data storage solutions. Rudolph’s transparent and metal film metrology systems provide our customers with the capability to quickly develop and characterize advanced film stacks for slider head and media manufacturing. Once a solution is developed, our systems provide the process control to deliver faster ramp to yield with a world-class cost of ownership model. A unique combination of capability and cost of ownership deliver success to our customers.
Simultaneous measurement with multi-wavelength, focused beam ellipsometry
Acoustic metrology and defect inspection for advanced semiconductor process control