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September 1, 2011

Advanced Analysis and Control Systems Could Multiply Yields in LED Manufacturing Processes

LEDs Magazine, September 2011

Significant yield enhancements in LED fabrication can be achieved by the integration of yield analysis, fault detection and classification, and run-to-run process control, says Michael Plisinski.

As demand for high-brightness LEDs continues to accelerate, manufacturers are turning to a potent combination of yield analysis, process control, equipment monitoring and factory automation to increase output, optimize profitability and gain strategic advantage in an increasingly competitive marketplace. While each of these components brings specific benefits, when intelligently integrated, their total combined benefit is far greater than the sum of their individual contributions.

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