Reflex TT
Table top wafer inspection for R&D
Cost-effective unpatterned wafer and mask blank inspection for research institutes, universities and consortia
Research, testing and prototyping are an important step in bringing new technologies to the semiconductor manufacturing floor. Rudolph provides an ideal solution to evaluate our unpatterned wafer inspection technologies by conducting process characterization studies and contamination monitoring prior to committing to HVM equipment purchases.
Learn more about the Reflex TT™ – a table-top, manually loaded wafer inspection tool for detecting particles, scratches, area defects and micro-roughness on unpatterned wafers and mask blanks.
Reflex TT MBI
Table top mask blank inspection for R&D
