Perfecting Yield with Proactive Optimization Throughout the Process and Across the Supply Chain
Increasingly dispersed and complex supply chains require a proactive, integrated, systems-level approach to optimizing yields. The ability for Proactive Yield Perfection to integrate data – sensor-deep and supply chain-wide – in a monolithic database streamlines analysis and finds relationships that are otherwise invisible. Die-level genealogy allows engineers to trace die histories backward to find root causes of failures and forward to identify other die similarly at-risk. The value of this solution is multiplied by the substantial investments made at each step of the process and the high cost and potential financial liability associated with failed, multi-chip modules.