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S3000A System

Optimized price and performance for non-diffusion film applications
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WS3840 System

Superior defect detection capability
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Harmony ASR Software

A fast, intuitive, off-line, all-surface review and classification solution
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02/21/2010

SPIE Advanced Lithography 2010

San Jose, CA
11/09/2009

Rudolph's Automated Data Analysis Software Improves Yield in MEMS Inspection

Touch Micro-SystemTech adds NSX with Discover Software to dramatically reduce per-wafer inspection time
11/02/2009

Rudolph Technologies Announces Third Quarter Revenue Increases 52 Percent Exceeding Guidance

10/08/2009

Rudolph Technologies Receives Multiple System Order from ASE for its Complete Portfolio of Back-end Inspection Solutions

Rudolph sees significant market potential as leading manufacturers implement data analysis capability in their 2D and 3D in-line inspection for advanced packaging processes