Efficient probe card test, analysis, and rework for fine pitch, small array probe cards
Probe Card Test and Analysis
Automated probe card test and repair is used to monitor probe card health to insure cards are ready and capable of testing semiconductor devices. Critical card metrics such as tip position, tip size, tip planarity, CRES, and electrical continuity are validated. In cases where the card is not meeting performance specification repairs may be performed such as tip adjustment or card cleaning, thus returning the card quickly to a production state.
Probe Card Interface
Acting as the interface between the probe card tester and the probe card, the Probe Card Interface (motherboard) is critical in simulating the tester interface on the test floor. Rudolph Technologies' engineers carefully consider probe card, tester, prober, probing process and probe card analyzer configuration details to produce an interface design that will provide precise and consistent measurement results.
High speed, high force, and high throughput for high pin-count, large array probe cards
Customer and application-specific mechanical and electrical interfaces that are critical for the probe card test and analysis process